Degradation analysis of the pinned photodiode CMOS image sensors induced by energetic proton radiation
Publication date: January 2024Source: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Volume 1058Author(s): Zujun Wang, Yuanyuan Xue, Zhongming Wang, Wei Chen, Liyuan Yin, …