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Category: American Institute of Physics

Investigation of time variations of redox reactions in SrRuO3 through interface-sensitive resistance measurements

Investigation of time variations of redox reactions in SrRuO3 through interface-sensitive resistance measurements

Journal of Applied Physics, Volume 133, Issue 12, March 2023. We used an interface-sensitive resistance measurement technique to observe the time evolution of the early stages of redox reactions at the interface between the metallic oxide SrRuO[math] a…

Resonance, Rayleigh flows, and thermal choking: Compressible coolant states in porous electromagnetic heat exchangers

Resonance, Rayleigh flows, and thermal choking: Compressible coolant states in porous electromagnetic heat exchangers

Journal of Applied Physics, Volume 133, Issue 12, March 2023. Electromagnetic (EM) heat exchangers (HX) are systems that convert EM energy into heat or mechanical work. One potential design consists of a porous lossy ceramic material heated by EM waves…

Scattering characteristics of electrically large arbitrarily shaped targets illuminated by an off-axis vortex electromagnetic beam

Scattering characteristics of electrically large arbitrarily shaped targets illuminated by an off-axis vortex electromagnetic beam

Journal of Applied Physics, Volume 133, Issue 12, March 2023. For the application of vortex electromagnetic (EM) beams in practical detection scenes, the scattering characteristics of electrically large arbitrarily shaped targets illuminated by an off-…

Utility of Shockley–Read–Hall analysis to extract defect properties from semiconductor minority carrier lifetime data

Utility of Shockley–Read–Hall analysis to extract defect properties from semiconductor minority carrier lifetime data

Journal of Applied Physics, Volume 133, Issue 12, March 2023. The semiconductor minority carrier lifetime contains information about several important material properties, including Shockley–Read–Hall defect levels/concentrations and radiative/Auger re…