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Month: January 2023

Analysis of Ti nanolayers irradiated with Xe<sup>q+</sup> ions using synchrotron radiation based X-ray reflectometry

Analysis of Ti nanolayers irradiated with Xe<sup>q+</sup> ions using synchrotron radiation based X-ray reflectometry

Publication date: March 2023Source: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 536Author(s): R. Stachura, D. Banaś, A. Kubala-Kukuś, I. Stabrawa, P. Jagodziński, K. Szary, A. Foks, …